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| TC4069UBP/UBF/UBFN/UBFT TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC4069UBP,TC4069UBF,TC4069UBFN,TC4069UBFT TC4069UB Hex Inverter TC4069UB contains six circuits of inverters. Since the internal circuit is composed of a single stage inverter, this is suitable for the applications of CR oscillator circuits, crystal oscillator circuits and linear amplifiers in addition to its application as inverters. Because of one stage gate configuration, the propagation time has been reduced. Note: xxxFN (JEDEC SOP) is not available in Japan. TC4069UBP Pin Assignment TC4069UBF I1 O1 I2 O2 I3 O3 VSS 1 2 3 4 5 6 7 (top view) 14 13 12 11 10 9 8 VDD I6 O6 I5 O5 I4 TC4069UBFN O4 Circuit Diagram 1/6 TC4069UB VDD TC4069UBFT INPUT OUTPUT Weight VSS DIP14-P-300-2.54 SOP14-P-300-1.27A SOL14-P-150-1.27 TSSOP14-P-0044-0.65A : 0.96 g (typ.) : 0.18 g (typ.) : 0.12 g (typ.) : 0.06 g (typ.) 1 2007-10-01 TC4069UBP/UBF/UBFN/UBFT Absolute Maximum Ratings (Note) Characteristics DC supply voltage Input voltage Output voltage DC input current Power dissipation Operating temperature range Storage temperature range Symbol VDD VIN VOUT IIN PD Topr Tstg Rating VSS - 0.5 to VSS + 20 VSS - 0.5 to VDD + 0.5 VSS - 0.5 to VDD + 0.5 10 300 (DIP)/180 (SOIC) -40 to 85 -65 to 150 Unit V V V mA mW C C Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Operating Ranges (VSS = 0 V) (Note) Characteristics DC supply voltage Input voltage Symbol VDD VIN Test Condition Min 3 0 Typ. Max 18 VDD Unit V V Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VDD or VSS. 2 2007-10-01 TC4069UBP/UBF/UBFN/UBFT Static Electrical Characteristics (VSS = 0 V) Test Condition Characteristics Symbol VDD (V) |IOUT| < 1 A VIN = VSS, VDD |IOUT| < 1 A VIN = VSS, VDD VOH = 4.6 V VOH = 2.5 V Output high current IOH VOH = 9.5 V VOH = 13.5 V VIN = VSS VOL = 0.4 V Output low current IOL VOL = 0.5 V VOL = 1.5 V VIN = VDD VOUT = 0.5 V, 4.5 V Input high voltage VIH VOUT = 1.0 V, 9.0 V VOUT = 1.5 V, 13.5 V |IOUT| < 1 A VOUT = 0.5 V, 4.5 V Input low voltage VIL VOUT = 1.0 V, 9.0 V VOUT = 1.5 V, 13.5 V |IOUT| < 1 A "H" level Input current "L" level Quiescent supply current IIH IIL VIL = 18 V VIL = 0 V VIN = VSS, VDD (Note) 18 18 5 10 15 0.1 -0.1 0.25 0.50 1.00 10- 5 -40C Min 4.95 9.95 14.95 -0.61 -2.50 -1.50 -4.00 Max 0.05 0.05 0.05 Min 4.95 9.95 14.95 -0.51 -2.10 -1.30 -3.40 25C Typ. 5.00 10.00 15.00 0.00 0.00 0.00 -1.0 -4.0 -2.2 -9.0 Max 0.05 0.05 0.05 Min 85C Max 0.05 0.05 0.05 mA V V Unit 5 10 15 5 10 15 5 5 10 15 4.95 9.95 14.95 -0.42 -1.70 -1.10 -2.80 High-level output voltage VOH Low-level output voltage VOL 5 10 15 0.61 1.50 4.00 0.51 1.30 3.40 1.2 3.2 12.0 0.42 1.10 2.80 mA 5 10 15 4.0 8.0 12.0 4.0 8.0 12.0 4.0 8.0 12.0 mA 5 10 15 1.0 2.0 3.0 1.0 2.0 3.0 1.0 2.0 3.0 mA 0.1 -0.1 0.25 0.50 1.00 1.0 A -1.0 7.5 15.0 30.0 A -10- 5 0.001 0.001 0.002 IDD Note: All valid input combinations. 3 2007-10-01 TC4069UBP/UBF/UBFN/UBFT Dynamic Electrical Characteristics (Ta = 25C, VSS = 0 V, CL = 50 pF) Characteristics Symbol Test Condition VDD (V) 5 tTLH 10 15 5 tTHL 10 15 5 tpLH 10 15 5 tpHL 10 15 CIN Min Typ. 70 35 30 70 35 30 55 30 25 55 30 25 7.5 Max 200 100 80 200 100 80 110 60 50 110 60 50 15 pF ns ns ns ns Unit Output transition time (low to high) Output transition time (high to low) Propagation delay time (low to high) Propagation delay time (high to low) Input capacitance Waveform for Measurement of Dynamic Characteristics 20 ns 90% 50% 10% tpHL 20 ns 90% 50% 10% tpLH Input Output tTHL tTLH 4 2007-10-01 TC4069UBP/UBF/UBFN/UBFT Package Dimensions Weight: 0.96 g (typ.) 5 2007-10-01 TC4069UBP/UBF/UBFN/UBFT Package Dimensions Weight: 0.18 g (typ.) 6 2007-10-01 TC4069UBP/UBF/UBFN/UBFT Package Dimensions (Note) Note: This package is not available in Japan. Weight: 0.12 g (typ.) 7 2007-10-01 TC4069UBP/UBF/UBFN/UBFT Package Dimensions Weight: 0.06 g (typ.) 8 2007-10-01 TC4069UBP/UBF/UBFN/UBFT RESTRICTIONS ON PRODUCT USE * The information contained herein is subject to change without notice. 20070701-EN GENERAL * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 9 2007-10-01 |
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